1–5 Jun 2026
Europe/Prague timezone

EUV AND X LINE PROFILES BROADENED BY COLLISIONS WITH CHARGED PARTICLES FOR PLASMA INVESTIGATION AND MODELLING

Not scheduled
20m
Poster

Description

The spectral line profiles broadened by collisions with charged particles of spectral lines in EUV and X wavelength range are useful for diagnostics and spectral analysis of different plasmas as for example for laser produced plasma in front of different targets in HHG experiments. We note as well that line profiles enter in the calculation of absorption coefficients, radiative transfer equation and other quantities useful for modelling, optimisation and characterization of plasma and such data are useful also for development of physical models of EUV/X-ray radiation-matter interaction.
In this contribution, we will discuss the significance of spectral line broadening by collisions with charged particles for investigations of EUV/X-ray spectral lines and radiation-matter interaction., we will give the basic informations on theoretical methods for calculation of spectral line shapes of isolated spectral lines of non-hydrogenic ions, their accuracy, as well as on the databases where such data could be found.

Primary author

Milan Dimitrijević (Astronomical Observatory, Belgrade, Serbia)

Presentation materials

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