- Marius Retegan (ESRF)
The day dedicated to X-rays will start with an introduction to synchrotron radiation and associated techniques, followed by a presentation on how X-ray spectroscopy is used to investigate the structural parameters and electronic properties of materials. We will introduce the spectroscopic techniques commonly used at the synchrotron light sources, such as X-ray absorption (XAS, HERFD, EXAFS), X-ray emission (XES), and resonant inelastic X-ray scattering (RIXS). In the last presentation of the morning session, we will showcase the available software tools for data analysis and computation.
The afternoon session will be hands-on. We will start by showing how experimental data can be accessed using the ESRF's data portal and how it can be processed using the Jupyter notebook. To help interpret the experimental spectra, the students will run calculations with selected theoretical methods.